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Chinese Chinese Products Equipment Series Equipment Series Unpatterned Wafer Defect Inspection Equipment Series Patterned Wafer Defect Inspection Equipment Series Metrology Equipment Series Overlay Metrology Equipment Series 3D Surface Profiling Metrology Equipment Series Dielectric Film Metrology Equipment Series Software series Software Yield Management System DMS/YMS Semiconductor Auto Defect Classification System Skyverse Company Introduction Development History Corporate Culture Certificates of Honor News News Recruitment Social Recruitment Campus Recruitment Contact Investor Relations Yield Management System DMS/YMS IVY Home > Products > Software Product Introduction IVY-DMS/YMS, the yield management system software, is the essential tool for analyzing yield-related data, such as inspection and measurement results. By using statistical analysis, machine learning methods, and customized workflows, it generates rich yield reports to provide powerful support for engineers' decisions. It promptly identifies abnormal states on the production line, assists PIE, YE, PE, and AOI in analyzing the reasons for yield decline, and effectively helps semiconductor companies improve yield and product performance. Product Features 1. Simple and intuitive IVY interface with drag-and-drop analysis, dynamic layouts, and high customizability to meet your individual needs. 2. Browser/Server architecture for rapid iterative custom development, seamlessly adapting to diverse application scenarios. 3. GPU computing and distributed architecture ensure uninterrupted operation 24/7, enabling smooth analysis of millions of defect data points. 4. Machine learning and deep learning models, combined with big data analytics, deliver comprehensive solutions for root cause analysis, predictive maintenance, and virtual metrology. 5. Data security is paramount. IVY adopts a cluster solution with load balancing, data backup, and restoration measures to ensure system stability and reliability. 6. Establishing AI models based on inspection data, metrology data, CP test data, WAT data, and WIP data to predict product yield and enhance yield rates. 7. Automated monitoring and yield analysis help save over 80% of manual effort, enhancing enterprise efficiency and profitability. Previous Product Null Next Product Semiconductor Auto Defect Classification System EAGLE Products Equipment Series Software series Skyverse Company Introduction Development History Corporate Culture Certificates of Honor News News Recruitment Social Recruitment Campus Recruitment Contact Investor Relations All rights reserved. Infringement will be investigated. 粤ICP备16055877号 WeChat QR Code -->

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